Last edited by Samuk
Saturday, April 18, 2020 | History

3 edition of Diffusion length measurements in bulk and epitaxially grown III-V semiconductors using charge collection microscopy found in the catalog.

Diffusion length measurements in bulk and epitaxially grown III-V semiconductors using charge collection microscopy

Diffusion length measurements in bulk and epitaxially grown III-V semiconductors using charge collection microscopy

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  • 15 Currently reading

Published by National Aeronautics and Space Administration, For sale by the National Technical Information Service in [Washington, DC], [Springfield, Va .
Written in English

    Subjects:
  • Microelectronics.,
  • Diodes.,
  • Semiconductors.

  • Edition Notes

    StatementR.P. Leon.
    SeriesNASA technical memorandum -- 100128.
    ContributionsUnited States. National Aeronautics and Space Administration.
    The Physical Object
    FormatMicroform
    Pagination1 v.
    ID Numbers
    Open LibraryOL15289283M


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Diffusion length measurements in bulk and epitaxially grown III-V semiconductors using charge collection microscopy Download PDF EPUB FB2